Application of Electronic Speckle Pattern Interferometry (ESPI) to Observe the Fracture Process Zone

E. Hack, H. Sadouki, T. Steiger (1995). "Application of Electronic Speckle Pattern Interferometry (ESPI) to Observe the Fracture Process Zone." In Proceedings of FraMCoS 2, Zurich, Switzerland.

E. Hack, H. Sadouki, T. Steiger. "Application of Electronic Speckle Pattern Interferometry (ESPI) to Observe the Fracture Process Zone." Paper presented at FraMCoS 2, Zurich, Switzerland, 1995.

E. Hack, H. Sadouki, T. Steiger, "Application of Electronic Speckle Pattern Interferometry (ESPI) to Observe the Fracture Process Zone," in Proc. FraMCoS 2, Zurich, Switzerland, 1995.

@inproceedings{e-hack1995,
  title     = {Application of Electronic Speckle Pattern Interferometry (ESPI) to Observe the Fracture Process Zone},
  author    = {E. Hack, H. Sadouki, T. Steiger},
  year      = {1995},
  booktitle = {Proceedings of FraMCoS 2},
  address   = {Zurich, Switzerland},
}

TY  - CPAPER
TI  - Application of Electronic Speckle Pattern Interferometry (ESPI) to Observe the Fracture Process Zone
AU  - E. Hack
AU  - H. Sadouki
AU  - T. Steiger
PY  - 1995
T2  - Proceedings of FraMCoS 2
CY  - Zurich, Switzerland
UR  - http://framcos.org/wp-content/uploads/framcos-papers/Application_of_Electronic_Speckle_Pattern_Interferometry_%28ESPI%29_to_Observe_the_F.pdf
ER  -